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Thermal Oxide Silicon Wafer 2-8 Inch SiO2 Layer Substrate

2-8 inch thermal oxide silicon wafers with precisely controlled SiO2 layers for IC dielectric and MEMS applications.

Substrate Diameter
2 inch to 8 inch
Base Wafer
CZ or FZ polished silicon wafer substrate
Oxide Layer Thickness
10 nm (thin gate oxide) to 2 μm (thick field oxide); custom thickness available
Thickness Uniformity
≤ ±3%

Describe Details

Our thermal oxide silicon wafer is a specialized semiconductor substrate featuring a uniformly grown silicon dioxide (SiO2) insulating layer on the surface of a high-quality polished silicon base wafer. The thermal oxide silicon wafer is produced through high-temperature thermal oxidation processes in controlled furnace atmospheres, where oxygen or water vapor reacts with the silicon surface at temperatures above 1000 degrees Celsius to grow a dense, high-quality SiO2 layer with precise thickness control across the entire wafer surface.

We manufacture thermal oxide silicon wafers in diameters from 2 inches to 8 inches, using both CZ and FZ base wafers to accommodate different application requirements. The oxide thickness range spans from thin gate-quality oxides of tens of nanometers to thick field oxides exceeding 2 micrometers, all precisely controlled to customer specifications within tight tolerance ranges. We offer both dry oxidation and wet oxidation processes: dry oxidation produces denser oxide films with higher dielectric strength ideal for gate dielectric applications, while wet oxidation enables faster growth rates for thicker oxide layer requirements. The thermally grown SiO2 layer provides excellent electrical insulation properties, superior surface passivation, and effective masking capability for ion implantation and diffusion processes, making the thermal oxide silicon wafer essential for numerous semiconductor fabrication sequences.



Each thermal oxide silicon wafer undergoes rigorous quality verification including oxide thickness measurement using ellipsometry across multiple measurement points, uniformity analysis across the wafer surface, pinhole detection through mercury probe testing, surface particle inspection, and dielectric breakdown voltage testing to ensure reliable insulating performance and consistent electrical properties. The oxide layers feature excellent step coverage, low defect density, and consistent refractive index properties critical for device performance and manufacturing yield. Our thermal oxide silicon wafer products find extensive applications in integrated circuit manufacturing, power device fabrication, MEMS structural layer formation, dielectric layer research, and as base substrates for subsequent thin film deposition and lithography processing steps.


Parameter Category Specifications
Substrate Diameter 2 inch to 8 inch
Base Wafer CZ or FZ polished silicon wafer substrate
Oxide Layer Thickness 10 nm (thin gate oxide) to 2 μm (thick field oxide); custom thickness available
Thickness Uniformity ≤ ±3%
Oxidation Process Dry thermal oxidation, Wet thermal oxidation
Process Features Dry oxidation: dense film structure, high breakdown voltage — ideal for gate oxide
Wet oxidation: fast growth rate — ideal for thick oxide layer fabrication
Breakdown Electric Field ≥ 8 MV/cm
Dielectric Constant Stable and consistent
Pinhole Density Extremely low
Substrate Doping N-type or P-type (optional)
Crystal Orientation <100> or <111>
Resistivity Range Wide range available (customizable)
Backside Treatment Oxide retained; Oxide removed by grinding/polishing; Backside gold metallization
Quality Documentation Per-batch multi-point oxide thickness test report, uniformity data, electrical performance test results
Applications IC dielectric layers, power device passivation, MEMS structural layers, semiconductor process R&D, laboratory teaching


As an experienced thermal oxide silicon wafer supplier, we offer both dry oxide and wet oxide growth options, with custom specifications available for base wafer resistivity, crystal orientation, and backside surface treatment including backside oxide removal or metallization options. All thermal oxide silicon wafers are processed and packaged in class 100 cleanroom environments, delivering consistent quality that semiconductor manufacturers and research institutions depend on for their device fabrication and experimental work. We provide flexible order sizes from small R&D quantities to volume production, with full quality documentation and technical support for every batch of thermal oxide silicon wafer products we deliver. We also offer custom oxide patterning and partial oxidation services upon request, enabling customers to obtain pre-processed substrates that accelerate their device development cycles and reduce in-house processing steps.

FAQ

Can I obtain samples?

Yes.

Can I use my own logo or design on the product?

Yes, we can label the products according to your requirements. Both internal and external labels are acceptable.

Do you have a factory?

Yes, we have a factory in Jiangsu. Welcome to visit our company and factory.

What is the production capacity of your factory?

Our main focus is on the product process and production cycle.

When will the shipment be made?

Based on your needs, we will arrange for same day shipment for items in stock, and for items out of stock, we will check the delivery date. Delivery will be made within the delivery time.